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MC100EP31DR2 View Datasheet(PDF) - ON Semiconductor

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Description
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MC100EP31DR2 Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
MC10EP31, MC100EP31
Table 4. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC
PECL Mode Power Supply
VEE
NECL Mode Power Supply
VI
PECL Mode Input Voltage
NECL Mode Input Voltage
Iout
Output Current
VEE = 0 V
VCC = 0 V
VEE = 0 V
VCC = 0 V
Continuous
Surge
VI v VCC
VI w VEE
6
V
6
V
6
V
6
V
50
mA
100
mA
TA
Operating Temperature Range
Tstg
Storage Temperature Range
qJA
Thermal Resistance (JunctiontoAmbient) 0 lfpm
500 lfpm
SOIC8
SOIC8
40 to +85
65 to +150
190
130
°C
°C
°C/W
°C/W
qJC
Thermal Resistance (JunctiontoCase)
Standard Board
SOIC8
qJA
Thermal Resistance (JunctiontoAmbient) 0 lfpm
500 lfpm
TSSOP8
TSSOP8
41 to 44
185
140
°C/W
°C/W
°C/W
qJC
Thermal Resistance (JunctiontoCase)
Standard Board
TSSOP8
qJA
Thermal Resistance (JunctiontoAmbient) 0 lfpm
500 lfpm
DFN8
DFN8
41 to 44
129
84
°C/W
°C/W
°C/W
Tsol
Wave Solder
Pb <2 to 3 sec @ 248°C
PbFree <2 to 3 sec @ 260°C
265
°C
265
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
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