datasheetbank_Logo
Integrated circuits, Transistor, Semiconductors Search and Datasheet PDF Download Site

MC100EL1648DTG View Datasheet(PDF) - ON Semiconductor

Part Name
Description
View to exact match
MC100EL1648DTG
ON-Semiconductor
ON Semiconductor ON-Semiconductor
MC100EL1648DTG Datasheet PDF : 16 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
MC100EL1648
GENERIC TEST CIRCUITS: Bypass to Supply Opposite GND
VCC
0.1 mF
0.1 mF
8 (10)
VIN
CL
1 KW
*
Tank #1
1 (12)
VEE
3 (1)
6 (7) 7 (8)
2 (14)
4 (3)
5 (5)
100 mF 0.01 mF
0.1 mF 0.1 mF
** FOUT
L = Micro Metal torroid #T20−22, 8 turns #30
Enameled Copper wire (@ 40 nH)
C = MMBV609
* Use high impedance probe (>1.0 MW must be
used).
** The 1200 W resistor and the scope termination
impedance constitute a 25:1 attenuator probe.
Coax shall be CT−070−50 or equivalent.
8 pin (14 pin) Lead Package
Tank Circuit Option #1, Varactor Diode
VCC
0.1mF
Test Point
0.1 mF
8 (10)
3 (1)
L
C
1 (12)
Tank #2
VEE
6 (7) 7 (8)
0.1 mF
2 (14)
4 (3)
FOUT
5 (5)
L = Micro Metal torroid #T20−22, 8 turns #30
Enameled Copper wire (@ 40 nH)
C = 3.0−35pF Variable Capacitance (@ 10 pF)
Note 1 Capacitor for tank may be variable type.
(See Tank Circuit #3.)
Note 2 Use high impedance probe (> 1 MW ).
8 pin (14 pin) Lead Package
100 mF 0.01 mF
0.1 mF 0.1 mF
Tank Circuit Option #2, Fixed LC
Figure 3. Typical Test Circuit with Alternate Tank Circuits
VP−P
50%
ta
tb
PRF = 1.0MHz
Duty Cycle (Vdc) −
ta
tb
Figure 4. Output Waveform
http://onsemi.com
5
 

Share Link: 

datasheetbank.com [ Privacy Policy ] [ Request Datasheet ] [ Contact Us ]