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MC100EL1648DT View Datasheet(PDF) - ON Semiconductor

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MC100EL1648DT Datasheet PDF : 16 Pages
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MC100EL1648
SPECTRAL PURITY
99.8
99.9
100.0
100.1
100.2
B.W. = 10 kHz, Center Frequency = 100 MHz
Scan Width = 50 kHz/div, Vertical Scale = 10 dB/div
Figure 15. Spectral Purity
8 (10)
0.1 mF
L
C
Tank #3 1 (12)
VEE
2 (14)
3(1)
0.1 mF 10 mF
6 (7) 7 (8)
1200*
4 (3)
5 (5)
SIGNAL
UNDER
TEST
100 mF 0.01 mF
0.1 mF 0.1 mF
L = Micro Metal torroid #T20−22, 8 turns #30
Enameled Copper wire (@ 40 nH)
C = 3.0−35 pF Variable Capacitance (@ 10 pF)
** The 1200 W resistor and the scope termination
impedance constitute a 25:1 attenuator probe.
Coax shall be CT−070−50 or equivalent.
8 pin (14 pin) Lead Package
Spectral Purity Test Circuit
Figure 16. Spectral Purity of Signal Output for 200 MHz Testing
Q
Driver
Device
Q
Zo = 50 W
Zo = 50 W
50 W
50 W
D
Receiver
Device
D
VTT
VTT = VCC − 2.0 V
Figure 17. Typical Termination for Output Driver and Device Evaluation
(See Application Note AND8020/D − Termination of ECL Logic Devices.)
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