M74HC4094C1R View Datasheet(PDF) - STMicroelectronics

Part Name

Description

View to exact match

M74HC4094C1R

8 BIT SIPO SHIFT LATCH REGISTER (3-STATE)

STMicroelectronics 

SWITCHING CHARACTERISTICS TEST WAVEFORM

M 54/ M74H C4094

TEST WAVEFORM ICC (Opr.)

CPD CALCULATION

CPD is to be calculated with the following for-

mula by using the measured value of ICC

(Opr.) in the test circuit opposite.

CPD=

ICC (Opr)

fIN × VCC

In determining the typical value of CPD, a

relatively high frequency of 1 MHz was ap-

plied to fIN, in order to eliminate any error

caused by the quiescent supply current.

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