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M25P32 View Datasheet(PDF) - Numonyx -> Micron

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M25P32 Datasheet PDF : 54 Pages
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M25P32
8
Initial delivery state
Initial delivery state
The device is delivered with the memory array erased: all bits are set to 1 (each byte
contains FFh). The Status Register contains 00h (all Status Register bits are 0).
9
Maximum rating
Stressing the device outside the ratings listed in Table 9 may cause permanent damage to
the device. These are stress ratings only, and operation of the device at these, or any other
conditions outside those indicated in the Operating sections of this specification, is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect
device reliability. Refer also to the STMicroelectronics SURE Program and other relevant
quality documents.
Table 9. Absolute maximum ratings
Symbol
Parameter
Min. Max. Unit
TSTG
TLEAD
VIO
Storage temperature
Lead temperature during soldering
Input and output voltage (with respect to Ground)
–65
150
°C
see (1)
°C
–0.6
VCC +
V
0.6
VCC Supply voltage
–0.6
4.0
V
VPP Fast Program/Erase voltage
–0.2 10.0
V
VESD Electrostatic Discharge Voltage (Human Body model) (2) –2000 2000
V
1. Compliant with JEDEC Std J-STD-020C (for small body, Sn-Pb or Pb assembly) and the European
directive on Restrictions on Hazardous Substances (RoHS) 2002/95/EU.
2. JEDEC Std JESD22-A114A (C1 = 100 pF, R1 = 1500 Ω, R2 = 500 Ω).
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