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LA75501V View Datasheet(PDF) - SANYO -> Panasonic

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LA75501V Datasheet PDF : 10 Pages
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LA75501V
S7.S8. PAL, NT de-emphasis [Pdeem, Ndeem]
(1) External AGC (V18 = VCC)
(2) fs = 5.5MHz fm = 3kHz F = ±30kHz
(SIF input Vi = 31.6mVrms)
(3) Open system switches (A (pin 13) and B (pin 14)). (BG mode)
(4) Measure the FM detector output voltage at test point D. ····· Vp
(5) Calculate as follows:
Pdeem (dB) = Vp VO (FM)
(6) fs = 4.5MHz fm = 2kHz F = ±30kHz
(SIF input Vi = 31.6mVrms)
(7) Set system switches [A (pin 13) and B (pin 14)] to GND. (NT mode)
(8) Measure the FM detector output voltage at test point D. ····· Vp
(9) Calculate as follows:
Ndeem (dB) = Vnt VO (FM)
S9. PAL/NT Audio voltage gain difference [GD]
(1) External AGC (V18 =VCC)
(2) fs = 4.5MHz fm = 400Hz F = ±30kHz
(SIF input Vi = 31.6mVrms)
(3) Set system switches [A (pin 13) and B (pin 14)] to GND.
(4) Measure the FM detector output voltage at test point D. ····· Vnt
(5) Calculate as follows:
GD (db) = Vnt VO (FM)
Specifications of any and all SANYO Semiconductor products described or contained herein stipulate the
performance, characteristics, and functions of the described products in the independent state, and are
not guarantees of the performance, characteristics, and functions of the described products as mounted
in the customer's products or equipment. To verify symptoms and states that cannot be evaluated in an
independent device, the customer should always evaluate and test devices mounted in the customer's
products or equipment.
SANYO Semiconductor Co., Ltd. strives to supply high-quality high-reliability products. However, any
and all semiconductor products fail with some probability. It is possible that these probabilistic failures
could give rise to accidents or events that could endanger human lives, that could give rise to smoke or
fire, or that could cause damage to other property. When designing equipment, adopt safety measures
so that these kinds of accidents or events cannot occur. Such measures include but are not limited to
protective circuits and error prevention circuits for safe design, redundant design, and structural design.
In the event that any or all SANYO Semiconductor products (including technical data,services) described
or contained herein are controlled under any of applicable local export control laws and regulations, such
products must not be exported without obtaining the export license from the authorities concerned in
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No part of this publication may be reproduced or transmitted in any form or by any means, electronic or
mechanical, including photocopying and recording, or any information storage or retrieval system, or
otherwise, without the prior written permission of SANYO Semiconductor Co., Ltd.
Any and all information described or contained herein are subject to change without notice due to
product/technology improvement, etc. When designing equipment, refer to the "Delivery Specification"
for the SANYO Semiconductor product that you intend to use.
Information (including circuit diagrams and circuit parameters) herein is for example only; it is not
guaranteed for volume production. SANYO Semiconductor believes information herein is accurate and
reliable, but no guarantees are made or implied regarding its use or any infringements of intellectual
property rights or other rights of third parties.
This catalog provides information as of February, 2006. Specifications and information herein are subject
to change without notice.
PS No.A0224-10/10
 

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