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ISL1209IU10 View Datasheet(PDF) - Intersil

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ISL1209IU10 Datasheet PDF : 24 Pages
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ISL1209
Absolute Maximum Ratings
Voltage on VDD, VBAT, SCL, SDA, and IRQ pins
(respect to ground) . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7.0V
Voltage on X1 and X2 pins
(respect to ground) . . . . . . . . . . . .-0.5V to VDD + 0.5 (VDD Mode)
-0.5V to VBAT + 0.5 (VBAT Mode)
Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . .-65°C to +150°C
Lead Temperature (Soldering, 10s) . . . . . . . . . . . . . . . . . . . . . 300°C
ESD Rating (Human Body Model) . . . . . . . . . . . . . . . . . . . . . . >±2kV
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
DC Operating Characteristics – RTC Test Conditions:VDD = +2.7 to +5.5V, Temperature = -40°C to +85°C, unless otherwise stated.
SYMBOL
PARAMETER
CONDITIONS
TYP
MIN (Note 4) MAX UNITS NOTES
VDD
VBAT
IDD1
IDD2
IDD3
IBAT
ILI
ILO
VTRIP
VTRIPHYS
VBATHYS
EVIN
Main Power Supply
Battery Supply Voltage
Supply Current
Supply Current With I2C Active
Supply Current (Low Power Mode)
Battery Supply Current
Input Leakage Current on SCL
I/O Leakage Current on SDA
VBAT Mode Threshold
VTRIP Hysteresis
VBAT Hysteresis
VDD = 5V
VDD = 3V
VDD = 5V
VDD = 5V, LPMODE = 1
VBAT = 3V
2.7
5.5
V
1.8
5.5
V
2
6
µA
1, 2
1.2
4
µA
40
120
µA
1, 2
1.4
5
µA
1
400
950
nA
1
100
nA
100
nA
1.6
2.2
2.6
V
10
30
50
mV
15
50
100
mV
VIL
VIH
Hysteresis
IEVPU
EVIN Pullup Current
IRQ/FOUT and EVDET
VOL
Output Low Voltage
VSUP = 3V
VDD = 5V, IOL = 3mA
VDD = 2.7V, IOL = 1mA
-0.3
0.3 x
V
VDD
0.7 x
VDD
VDD +
V
0.3
0.05 x
V
VDD
1.5
µA
5
0.4
V
0.4
V
Power-Down Timing Test Conditions:VDD = +2.7 to +5.5V, Temperature = -40°C to +85°C, unless otherwise stated.
SYMBOL
PARAMETER
CONDITIONS
TYP
MIN (Note 4) MAX UNITS
VDD SR-
VDD Negative Slew rate
10
V/ms
NOTES
3
3
FN6109.1
September 27, 2005
 

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