datasheetbank_Logo
Integrated circuits, Transistor, Semiconductors Search and Datasheet PDF Download Site

HS-1840RH/883S View Datasheet(PDF) - Intersil

Part Name
Description
View to exact match
HS-1840RH/883S Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
HS-1840RH/883S
Intersil - Space Level Product Flow
SEM - Traceable to Diffusion Method 2018
Wafer Lot Acceptance Method 5007
Internal Visual Inspection (Note 1)
Gamma Radiation Assurance Tests Method 1019
100% Nondestructive Bond Pull Method 2023
Customer Pre-Cap Visual Inspection (Notes 1, 2)
Temperature Cycling Method 1010 Condition C
Constant Acceleration method 2001 Y1 30KG
Particle Impact Noise Detection method 2020,
Condition A 20G
Marking and Serialization
X-Ray Inspection Method 2012
Initial Electrical Tests (T0)
Static Burn-In 72 Hour, +125oC method 1015 Condition A
Room Temperature Electrical Tests (T1)
Burn-In Delta Calculation (T0-T1)
PDA Calculation 3% Functional
5% Subgroups 1, 7,
Dynamic Burn-In 240 Hours, +125oC Method 1015
Condition D
Electrical Tests Subgroups 1, 7, 9 (T2)
Burn-In Delta Calculation (T0 - T2)
PDA Calculation 3% Functional
5% Subgroups 1, 7,
Electrical Test +125oC, -55oC
Alternate Group A Inspection Method 5005
Fine and Gross Leak Tests Method 1014
Customer Source Inspection (Note 2)
Group B Inspection (Notes 2, 4) Method 5005
Group D Inspection (Notes 2, 4) Method 5005
External Visual Inspection Method 2009
Data Package Generation (Note 3)
NOTES:
1. Visual Inspection is performed to MIL-STD-883 Method 2010, Condition A.
2. These steps are optional, and should be listed on the purchase order if required.
3. Data package contains: Assembly Attributes (post seal)
Test Attributes (includes Group A) -55oC, +25oC, +125oC
Shippable Serial Number List
Radiation Testing Certificate of Conformance
Wafer Lot Acceptance Report (includes SEM report)
X-Ray Report and Film
Test Variables Data, DC Test and TELQV
+25oC Initial Test
+25oC Interim Test 1
+25oC Interim Test 2
+25oC Delta Over Burn-In
4. Group B data package contains Attributes Data pulse Variables Data, DC Test and TE2HQV. Group D data package contains Attributes only.
10
 

Share Link: 

datasheetbank.com [ Privacy Policy ] [ Request Datasheet ] [ Contact Us ]