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Q-5962D9569301V9A View Datasheet(PDF) - Intersil

Part NameDescriptionManufacturer
Q-5962D9569301V9A Radiation Hardened Single 16/Differential 8 Channel CMOS Analog Multiplexers with Active Overvoltage Protection Intersil
Intersil Intersil
Q-5962D9569301V9A Datasheet PDF : 6 Pages
1 2 3 4 5 6
HS-0546RH, HS-0547RH
Burn-In/Life Test Circuits
V1
C1 D1
F3
1
2
R1 3
4
5
6
7
8
9
10
11
12
13
14
R2
28
27
26
25
24
23
22
21
20
19
18
17
16
15
V2
D2 C2
F4
F0
F1
F2
V2
C1 D1
V1
1
2
R1 3
4
5
6
7
8
9
10
11
12
13
14
R2
28
27
26
25
24
23
22
21
20
19
18
17
16
15
V3
D2 C2
DYNAMIC AND LIFE TEST
NOTES:
1. The Dynamic Test Circuit is utilized for all life testing.
2. V1 = +15V minimum, +16V maximum.
3. V2 = -15V maximum, -16V minimum.
4. R1, R2 = 10k, ±5%, 1/4 or 1/2W (per socket).
5. C1, C2 = 0.01µF minimum (per socket) or 0.1µF minimum
(per row).
6. D1, D2 = 1N4002 or equivalent (per board).
7. F0 = 100kHz, 10%; F1 = F0/2; F2 = F1/2; F3 = F2/2; F4 = F3/2
40% - 60% duty cycle; VIL = 0.8V maximum;
VIH = 4.0V minimum.
STATIC
NOTES:
8. V1 = +5V minimum, +6V maximum.
9. V2 = +15V minimum, +16V maximum.
10. V3 = -15V maximum, -16V minimum.
11. R1, R2 = 10k, ±5%, 1/4 or 1/2W (per socket).
12. C1, C2 = 0.01µF minimum (per socket) or 0.1µF minimum
(per row).
13. D1, D2 = 1N4002 or equivalent (per board).
Irradiation Circuit
+15V
1
2
10k
NC
3
+1V
4
5
6
7
8
9
10
11
12
13
14
+5V
28
27
-15V
10k
26
25
24
23
22
21
20
19
18
17
16
15
5
FN3544.4
March 13, 2006
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