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74HC(T)165-Q100 View Datasheet(PDF) - NXP Semiconductors.

Part NameDescriptionManufacturer
74HC(T)165-Q100 NXP Logic – Q100 logic portfolio NXP
NXP Semiconductors. NXP
74HC(T)165-Q100 Datasheet PDF : 2 Pages
1 2
Introduction
The operating environment of automobile semiconductor components is much more hostile than that of semiconductors used
in home or portable applications. A television set will generally spend its operating lifetime within an ambient temperature
range of 0 ˚C to 40 ˚C. Due to internal heating, its semiconductor devices can be expected to operate between 20 ˚C and 60 ˚C.
By comparison, an automobile is expected to start at temperatures lower than -20 ˚C and, in some cases, operate within the
engine compartment at temperatures approaching 125 ˚C.
To ensure the reliability of automotive electronics, the Automotive Electronics Council introduced its AEC-Q100 standard which
outlines procedures to be followed to ensure integrated circuits meet the quality and reliability levels required by automotive
applications. As the global number one supplier, the introduction of its Q100 logic portfolio shows NXP continuing to lead the
way in automotive logic.
Key benefits of the Q100 logic portfolio
AEC-Q100 product qualification and reliability monitoring
Quality Summary
Logic Products & MCU
Q1/Q2 – 2012
Emile Busink
Quality Assurance
Logic Products / MCU
NXP Semiconductors
Building FB-3.107
Gerstweg 2
6534 AE Nijmegen
The Netherlands
Date:
Report:
Tel:
Fax:
Email:
September 01st, 2012
RNR-31/O2172 (rev. CT)
int + 31 24 353 2116
int + 31 24 353 2820
emile.busink@nxp.com
NXP Semiconductors B.V., Gerstweg 2, 6534 AE Nijmegen, The Netherlands
Tel:+ 31 24 3539111 www.nxp.com, Commercial Register Eindhoven no. 17070621
Operating at elevated temperatures reduces the lifetime of a
semiconductor and temperature cycling has a negative impact on
the stability of a package. In cases where there is no history of a
product’s reliability within automotive applications, a series of
stresses to simulate the life cycle within an automotive environment
must be applied to guarantee conformance to the AEC-Q100
standard.
To ensure continued reliability, NXP logic maintains an extensive
reliability monitoring program; the results of which are published
half yearly. These QSUM reports are available upon request via
your NXP sales representative.
Tightened manufacturing process controls
Q100 devices are
 manufactured in TS16949 certified and VDA approved production facilities
 flagged as automotive lots
 subjected to additional process flow quality gates and stricter rules for lot dis-positioning and maverick lot handling
This ensures that automotive products
 receive highest priority
 have greater traceability for improved quality analysis
 that become outlier lots, passing a quality gate but outside of the acceptable distribution, are assigned to standard,
non-Q100, types.
Six sigma design, zero defect test and inspection methodology
Six sigma design philosophy is applied to all Q100 devices. This ensures that an end user application designed to the datasheet
limits can tolerate a shift as high as one and a half sigma in NXP’s manufacturing processes. As the process control limits are
much tighter than one and a half sigma, this virtually guarantees trouble free end user applications. During electrical test
process, average test limits or statistical test limits are applied to screen outliers within automotive lots. Figure 1 shows the
distribution of devices passing a test and the calculated statistical test limits in red. Although the outliers are within the upper
and lower specification limits they are not delivered as Q100 products.
LSL
USL
Statistical test
limits
Outliers
Outliers
Fig. 1 Application of statistical test limits
Dedicated website and datasheets
A summary of NXP logic’s Q100 portfolio including a search by function and a parametric search within each function can be
found at www.nxp.com/products/automotive/logic, and unlike the standard types, each Q100 device has a dedicated datasheet
confirming that it has been qualified in accordance with AEC-Q100 and is suitable for automotive applications.
Priority technical support
NXP’s first and second tier technical support teams give Q100 product design-in assistance their highest priority and upon
request AEC-Q100 production part approval process (PPAP) qualification data will be made available. Due to the stricter
qualification requirements of automotive end user applications, a 180 day process change notification (PCN) approval cycle is
applied for Q100 products instead of the 90 day PCN approval cycle for standard types. In the unlikely event of a quality issue,
NXP logic guarantees a 10 day through put time with initial verification within 24 hours for its Q100 portfolio.
Examples of NXP Q100 logic automotive application areas
i/o expansion
Large pin count controllers are expensive, so when possible to reduce the complexity and pin-count of control solutions, input/
output expansion devices such as multiplexer/de-multiplexer devices are used. Figure 2 shows an example of an 8:1 multiplexer
used to sequentially switch analog sensor signals to a single analog to digital pin of a micro-controller.
Interface logic
With high impedance inputs and low impedance outputs, interface logic such as registered or unregistered buffers and line
drivers are used to interface between low drive outputs of a controller and higher loads of, for example, water pumps and
window motors.
Display drivers
Display drivers integrate serial-in, parallel-out shift registers, which are common I/O expansion devices, with a number of
MOSFET LED drivers. With 8-bit and 12-bit solutions, shift register based display drivers enable a controller to drive 8 or 12 LED’s
using 3 output lines. Cascading devices as shown in figure 3 increases the number of LED’s controlled by the same 3 output lines.
Display drivers reduce the size, complexity, pin count and ultimately cost of any micro-controller based solution.
Control logic
Control applications such as engine control units and body control modules change settings based upon a combination of input
signals. Control logic consists of simple Boolean functions, such as AND or NAND, to facilitate changing settings in simple
sub-systems that don’t require a micro-controller.
Display Logic
HEF4894B-Q100
NPIC6C595-Q100
NPIC6C596-Q100
Interface logic
HEF4093BT-Q100
HEF4094BT-Q100
74HC(T)14-Q100
74HC(T)151-Q100
74HC(T)244-Q100
74AHC(T)14-Q100
74AHC(T)1G08-Q100
74AHC1G09-Q100
74AHC(T)1G125-Q100
74AHC(T)244-Q100
74AHC(T)125-Q100
Control Logic
HEF40106B-Q100
74HC(T)00-Q100
74HC(T)04-Q100
74HC(T)08-Q100
74HC(T)132-Q100
74HC(T)1G08-Q100
74LVC1G08-Q100
Function
12-stage shift-and-store register
LED driver
power logic 8-bit shift register;
open-drain
power logic 8-bit shift register;
open-drain
Function
Control Logic
74LVC1G125-Q100
74LVC1G14-Q100
74LVC1G17-Q100
74LVC1G32-Q100
quad 2-input NAND Schmitt trigger 74LVC244A-Q100
8-stage shift-and-store register
74LVC245A-Q100
hex inverting Schmitt trigger
I/O expansion
quad 2-input multiplexer
NX3L4051-Q100
octal buffer/line driver; 3-state
HEF4051B-Q100
hex inverting Schmitt trigger
HEF4052B-Q100
2-input AND gate
HEF4066BT-Q100
2-input AND gate with open-drain 74HC(T)138-Q100
bus buffer/line driver; 3-state
74HC(T)165-Q100
bus buffer/line driver; 3-state
74HC(T)4051-Q100
quad buffer/line driver; 3-state
74HC(T)4052-Q100
Function
74HC(T)4053-Q100
hex inverting Schmitt trigger
74HC(T)4066-Q100
quad 2-input NAND gate
74HC(T)4851-Q100
hex inverter
74HC(T)4852-Q100
quad 2-input AND gate
74HC(T)595-Q100
quad 2-input NAND Schmitt trigger 74LVC08-Q100
2-input AND gate
74LVC14-Q100
single 2-input AND gate
Function
bus buffer/line driver; 3-state
single Schmitt trigger inverter
single Schmitt trigger buffer
single 2-input OR gate
octal buffer/line driver; 3-state
octal bus transceiver; 3-state
Function
low-ohmic single-pole octal-throw analog switch
8-channel analog multiplexer/demultiplexer
dual 4-channel analog multiplexer/demultiplexer
quad single-pole single-throw analog switch
3-to-8 line decoder/demultiplexer; inverting
8-bit parallel-in/serial out shift register
8-channel analog multiplexer/demultiplexer
dual 4-channel analog multiplexer/demultiplexer
triple 2-channel analog multiplexer/demultiplexer
16-channel analog multiplexer/demultiplexer
8-channel analog mux/demux; injection-current control
dual 4-channel analog mux/demux; injection-current control
8-bit serial-in, serial or parallel-out shift register; 3-state
quad 2-input AND gate
hex inverting Schmitt trigger with 5 V tolerant input
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