HCF40174BC1 View Datasheet(PDF) - STMicroelectronics
Part Name
Description
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HCF40174BC1 Datasheet PDF : 12 Pages
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HCC/HCF40174B
DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25°C, CL = 50pF, RL = 200kΩ,
typical temperature coefficient for all VDD values is 0.3%/°C, all input rise and fall time = 20ns)
Symbol
Parameter
t PLH ,
tPHL
Propagation Delay Time
Clock to Output
Test Conditions
V DD (V)
5
10
Min.
Value
Typ.
150
70
Max.
300
140
15
50 100
tPHL Propagation Delay Time
Clear to Output
5
100 200
10
50 100
15
40 80
tT HL,
tT LH
Transition Time
5
100 200
10
50 100
15
40 80
ts e t up
Data Setup Time
5
40 20
10
20 10
15
10
0
thol d
Data Hold Time
5
80 40
10
40 20
tW
Clock Input Pulse Width
Low Level
15
30 15
5
130 65
10
60 30
15
40 20
tW
Clock Input Pulse Width
High Level
5
130 65
10
60 30
15
40 20
tW
Clear Input Pulse Width
Low Level
5
100 50
10
50 25
tr, tf Clock Input Rise or Fall Time
15
40 20
5
15
10
15
15
15
trem
Clear Removal Time
5
0 – 40
10
0 – 15
15
0 – 10
fCL
Maximum Clock Input Frequency
5
3.5
7
10
6
12
15
8
16
Unit
ns
ns
ns
ns
ns
ns
ns
ns
µs
ns
MHz
5/12
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