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FQP30N06-2003 View Datasheet(PDF) - Fairchild Semiconductor

Part NameDescriptionManufacturer
FQP30N06(2003) N-Channel QFET® MOSFET Fairchild
Fairchild Semiconductor Fairchild
FQP30N06 Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
Peak Diode Recovery dv/dt Test Circuit & Waveforms
DUT
+
VDS
_
I SD
L
Driver
RG
Same Type
as DUT
VDD
VGS
• dv/dt controlled by RG
• ISD controlled by pulse period
VGS
( Driver )
I SD
( DUT )
VDS
( DUT )
D
=
--G--a--t-e--P--u--l-s-e---W---i-d-t-h--
Gate Pulse Period
10V
IFM , Body Diode Forward Current
di/dt
IRM
Body Diode Reverse Current
Body Diode Recovery dv/dt
VSD
VDD
Body Diode
Forward Voltage Drop
©2003 Fairchild Semiconductor Corporation
Rev. A2, March 2003
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