HCF40181BM1 View Datasheet(PDF) - STMicroelectronics

Part Name

Description

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HCF40181BM1

4-BIT ARITHMETIC LOGIC UNIT

STMicroelectronics 

HCF40181B

DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25°C, CL = 50pF, RL = 200KΩ, tr = tf = 20 ns)

Symbol

Parameter

VDD (V)

Test Condition

Value (*)

Unit

Min. Typ. Max.

tPHL tPLH Propagation Delay Time

5

A or B to F (logic mode)

10

A or B to G or P

15

A or B to F,

5

Cn+4, or A = B

10

15

Cn to F

5

10

15

Cn to Cn+4

5

10

15

tTHL tTLH Transition Time

5

10

15

400 800

160 320 ns

120 240

500 1000

200 400 ns

140 280

320 640

135 270 ns

100 200

200 400

100 200 ns

70 140

100 200

50 100 ns

40 80

(*) Typical temperature coefficient for all VDD value is 0.3 %/°C

(1) : If more than one unit is cascaded. tr should be made less than or equal to the sum of the transition time and the fixed propagation delay

of the output of the driving stage for the estimated capacitive load.

TEST CIRCUIT

CL = 50pF or equivalent (includes jig and probe capacitance)

RL = 200KΩ

RT = ZOUT of pulse generator (typically 50Ω)

7/10

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