FAN4010IL6X_F113 View Datasheet(PDF) - Fairchild Semiconductor
Part Name
Description
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FAN4010IL6X_F113 Datasheet PDF : 9 Pages
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Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be operable
above the recommended operating conditions and stressing the parts to these levels is not recommended. In addition,
extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute
maximum ratings are stress ratings only.
Symbol
VS
VIN
Parameter
Supply Voltage
Input Voltage Range
Min.
0
0
Max.
6.3
6.3
Unit
V
V
Reliability Information
Symbol
TJ
TSTG
TL
Parameter
Junction Temperature
Storage Temperature Range
Reflow Temperature (Soldering)
Min.
-65
Typ.
θJA
Package Thermal Resistance(1)
456
Note:
1. Package thermal resistance (θJA), JEDEC standard, multi-layer test boards, still air.
Max.
+150
+150
+260
Unit
°C
°C
°C
°C/W
Electrostatic Discharge Protection
Symbol
HBM
CDM
ESD Standard
Human Body Model
Charged Device Model
Value
5kV
1kV
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended ope-
rating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not recom-
mend exceeding them or designing to absolute maximum ratings.
Symbol
TA
VS
VIN
VSENSE
Parameter
Operating Temperature Range
Supply Voltage Range
Input Voltage Range
Sensor Voltage Range, VSENSE = VIN - VLoad; ROUT = 0Ω
Min.
-40
2
2
0
Typ.
Max.
+85
6
6
2.5
Unit
°C
V
V
V
© 2007 Fairchild Semiconductor Corporation
FAN4010 Rev. 1.0.5
3
www.fairchildsemi.com
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