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EN29LV160AB-90BC View Datasheet(PDF) - Eon Silicon Solution Inc.

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EN29LV160AB-90BC Datasheet PDF : 43 Pages
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EN29LV160A
Figure 10. Alternate CE# Controlled Write Operation Timings
0x555 for Program
0x2AA for Erase
PA for Program
SA for Sector Erase
0x555 for Chip Erase
Addresses
VA
tWC
tAS
tAH
WE#
OE#
CE#
tGHEL
tWS
Data
RY/BY#
tRH
Reset#
tWH
tCP
tCPH
tDS
tDH
0xA0 for
Program
tCWHWH1 / tCWHWH2 / tCWHWH3
tBUSY
PD for Program
0x30 for Sector Erase
0x10 for Chip Erase
Status
DOUT
Notes:
PA = address of the memory location to be programmed.
PD = data to be programmed at byte address.
VA = Valid Address for reading program or erase status
Dout = array data read at VA
Shown above are the last two cycles of the program or erase command sequence and the last status read cycle
Reset# shown to illustrate tRH measurement references. It cannot occur as shown during a valid command
sequence.
Figure 11. DQ2 vs. DQ6
Enter
Embedded
Erase
WE#
Erase
Erase
Suspend
Enter Erase
Suspend
Program
Erase
Resume
Enter
Suspend
Read
Enter
Suspend
Program
Erase
Suspend
Read
Erase
Erase
Complete
DQ6
DQ2
This Data Sheet may be revised by subsequent versions 36 ©2004 Eon Silicon Solution, Inc., www.essi.com.tw
or modifications due to changes in technical specifications.
Rev. C, Issue Date: 2005/01/07
 

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