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DAC3151 View Datasheet(PDF) - Texas Instruments

Part NameDescriptionManufacturer
DAC3151 Single 14-/12-/10-Bit 500 MSPS Digital-to-Analog Converters TI
Texas Instruments TI
DAC3151 Datasheet PDF : 57 Pages
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DAC3151
DAC3161
DAC3171
SLAS959A – AUGUST 2013 – REVISED AUGUST 2013
DEFINITION OF SPECIFICATIONS
Adjacent Carrier Leakage Ratio (ACLR): Defined as the ratio in decibles relative to the carrier (dBc) between
the measured power within a channel and that of an adjacent channel.
Analog and Digital Power Supply Rejection Ratio (APSSR, DPSSR): Defined as the percentage error in the
ratio of the delta IOUT and delta supply voltage normalized with respect to the ideal IOUT current.
Differential Nonlinearity (DNL): Defined as the variation in analog output associated with an ideal 1 LSB
change in the digital input code.
Gain Drift: Defined as the maximum change in gain, in terms of ppm of full-scale range (FSR) per °C, from the
value at ambient (25°C) to values over the full operating temperature range.
Gain Error: Defined as the percentage error (in FSR%) for the ratio between the measured full-scale output
current and the ideal full-scale output current.
Integral Nonlinearity (INL): Defined as the maximum deviation of the actual analog output from the ideal output,
determined by a straight line drawn from zero scale to full scale.
Intermodulation Distortion (IMD3): The two-tone IMD3 is defined as the ratio (in dBc) of the 3rd-order
intermodulation distortion product to either fundamental output tone.
Offset Drift: Defined as the maximum change in DC offset, in terms of ppm of full-scale range (FSR) per °C,
from the value at ambient (25°C) to values over the full operating temperature range.
Offset Error: Defined as the percentage error (in FSR%) for the ratio between the measured mid-scale output
current and the ideal mid-scale output current.
Output Compliance Range: Defined as the minimum and maximum allowable voltage at the output of the
current-output DAC. Exceeding this limit may result reduced reliability of the device or adversely affecting
distortion performance.
Reference Voltage Drift: Defined as the maximum change of the reference voltage in ppm per degree Celsius
from value at ambient (25°C) to values over the full operating temperature range.
Spurious Free Dynamic Range (SFDR): Defined as the difference (in dBc) between the peak amplitude of the
output signal and the peak spurious signal.
Signal to Noise Ratio (SNR): Defined as the ratio of the RMS value of the fundamental output signal to the
RMS sum of all other spectral components below the Nyquist frequency, including noise, but excluding the first
six harmonics and dc.
TIMING DIAGRAMS
D[9:0]P/N
A3[9:0] A4[9:0] A5[9:0] A6[9:0] A7[9:0] A8[9:0] A9[9:0] A10[9:0] A11[9:0]
DATACLKP/N
(SDR)
ts(DATA)
th(DATA)
SYNCP/N
ts(DATA)
th(DATA)
Resets write pointer to position 0
Figure 66. DAC3151 Input Data Timing Diagram
Copyright © 2013, Texas Instruments Incorporated
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