SLAS959A – AUGUST 2013 – REVISED AUGUST 2013
Single 14-/12-/10-Bit 500 MSPS Digital-to-Analog Converters
Check for Samples: DAC3151, DAC3161, DAC3171
•2 Single Channel
– DAC3151: 10-Bit
– DAC3161: 12-Bit
– DAC3171: 14-Bit
• Maximum Sample Rate: 500 MSPS
• Pin-Compatible Family
• Input Interface:
– Parallel LVDS Inputs
– Single or Dual DDR Data Clock
– Internal FIFO
• Chip to Chip Synchronization
• Power Dissipation: 375mW
• Spectral Performance at 20 MHz IF
– SNR: 76 dBFS for DAC3171; 72dBFS for
DAC3161; 62 dBFS for DAC3151
– SFDR: 78 dBc for DAC3171; 77dBc for
DAC3161; 76 dBc for DAC3151
• Current Sourcing DACs
• Compliance Range: -0.5V to 1V
• Package: 64 Pin QFN (9x9mm)
• Wireless Infrastructure
– PA Bias, Envelope Tracking, TX
• Software-Defined Radio
• Signal/Waveform Generators
• Cable Head-End Equipment
The DAC3151/DAC3161/DAC3171 is a family of
single channel 500MSPS digital-to-analog converters
with resolutions of 10-/12-/14-bits. The family uses a
10-/12-/14-bit wide LVDS digital bus with an input
FIFO. The 14-bit DAC3171 also supports a DDR 7-bit
LVDS interface mode. FIFO input and output pointers
can be synchronized across multiple devices for
precise signal synchronization. The DAC outputs are
current sourcing and terminate to GND with a
compliance range of -0.5 to 1V.
DAC3151/DAC3161/DAC3171 is pin compatible with
the dual-channel, 10-/12-/14-bit, 500MSPS digital-to-
analog converter DAC3154/DAC3164/DAC3174.
The device is available in a QFN-64 PowerPAD™
package is specified over the full industrial
temperature range (–40°C to 85°C).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PowerPAD is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated