CXK5T8512TN-10LLX View Datasheet(PDF) - Sony Semiconductor
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CXK5T8512TN-10LLX Datasheet PDF : 10 Pages
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CXK5T8512TM/TN
• Read cycle (WE = “H”)
VCC = 2.7 to 3.6V
VCC = 3.3V ± 0.3V
Item
Symbol -10LLX
-12LLX
-10LLX
-12LLX Unit
Min. Max. Min. Max. Min. Max. Min. Max.
Read cycle time
tRC
100 — 120 — 85 — 100 — ns
Address access time
tAA
— 100 — 120 — 85 — 100 ns
Chip enable access time (CE1)
tCO1
— 100 — 120 — 85 — 100 ns
Chip enable access time (CE2)
tCO2
— 100 — 120 — 85 — 100 ns
Output enable to output valid
tOE
— 50 — 60 — 40 — 50 ns
Output hold from address change
tOH
10 — 10 — 10 — 10 — ns
Chip enable to output in low Z
(CE1, CE2)
tLZ1
tLZ2
10 — 10 — 10 — 10 — ns
Output enable to output in low Z (OE) tOLZ
5 — 5 — 5 — 5 — ns
Chip disable to output in high Z
(CE1, CE2)
tHZ1∗1
tHZ2∗1
—
40
—
40
—
35
—
40 ns
Output disable to output in high Z (OE) tOHZ∗1 — 35 — 35 — 30 — 35 ns
∗1 tHZ1, tHZ2 and tOHZ are defined as the time required for outputs to turn to high impedance state and are not
referred to as output voltage levels.
• Write cycle
VCC = 2.7 to 3.6V
VCC = 3.3V ± 0.3V
Item
Symbol -10LLX
-12LLX
-10LLX
-12LLX Unit
Min. Max. Min. Max. Min. Max. Min. Max.
Write cycle time
tWC 100 — 120 — 85 — 100 — ns
Address valid to end of write
tAW
80 — 100 — 70 — 80 — ns
Chip enable to end of write
tCW
80 — 100 — 70 — 80 — ns
Data to write time overlap
tDW
40 — 50 — 35 — 40 — ns
Data hold from write time
tDH
0 — 0 — 0 — 0 — ns
Write pulse width
tWP
70 — 70 — 60 — 70 — ns
Address setup time
tAS
0 — 0 — 0 — 0 — ns
Write recovery time (WE)
tWR
5 — 5 — 5 — 5 — ns
Write recovery time (CE1, CE2)
tWR1
5 — 5 — 5 — 5 — ns
Output active from end of write
Write to output in high Z
tOW
5 — 5 — 5 — 5 — ns
tWHZ∗2 — 40 — 40 — 35 — 40 ns
∗2 tWHZ is defined as the time required for outputs to turn to high impedance state and is not referred to as
output voltage level.
–5–
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