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CXK5T8512TN View Datasheet(PDF) - Sony Semiconductor

Part NameDescriptionManufacturer
CXK5T8512TN 65536-word × 8-bit High Speed CMOS Static RAM Sony
Sony Semiconductor Sony
CXK5T8512TN Datasheet PDF : 10 Pages
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I/O capacitance
Item
Symbol Test conditions Min.
Input capacitance
CIN
VIN = 0V
I/O capacitance
CI/O
VI/O = 0V
Note) This parameter is sampled and is not 100% tested.
(Ta = 25°C, f = 1MHz)
Typ. Max. Unit
8 pF
10 pF
CXK5T8512TM/TN
AC Characteristics
• AC test conditions
(Ta = –25 to +85°C)
Item
Input pulse high level
Conditions
VCC = 2.7 to 3.6V VCC = 3.3V ± 0.3V
VIH = 2.4V
VIH = 2.2V
Input pulse low level
Input rise time
Input fall time
VIL = 0.4V
tr = 5ns
tf = 5ns
VIL = 0.6V
tr = 5ns
tf = 5ns
Input and output reference level
-10LLX
Output load conditions
-12LLX
1.4V
CL1 = 100pF, 1TTL
CL1 = 100pF, 1TTL
1.4V
CL1 = 30pF, 1TTL
CL1 = 100pF, 1TTL
1 CL includes scope and jig capacitances.
Test circuit
TTL
CL
–4–
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