datasheetbank_Logo
Integrated circuits, Transistor, Semiconductors Search and Datasheet PDF Download Site

MC145191F View Datasheet(PDF) - Motorola => Freescale

Part Name
Description
View to exact match
MC145191F
Motorola
Motorola => Freescale Motorola
MC145191F Datasheet PDF : 24 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
LOOP SPECIFICATIONS (VDD = VCC = 4.5 to 5.5 V unless otherwise indicated, TA = – 40 to + 85°C)
Symbol
Parameter
Test Condition
Guaranteed
Figure Operating Range
No.
Min
Max
Unit
Vin
fref
fXTAL
Input Voltage Range, fin
Input Frequency Range, REFin
Externally Driven in
Reference Mode
Crystal Frequency, Crystal Mode
100 MHz fin < 250 MHz
250 MHz fin 1100 MHz
MC145190
MC145191
Vin 400 mV p–p
Vin 1 V p–p
Vin 400 mV p–p
Vin 1 V p–p
C1 30 pF, C2 30 pF, Includes
Stray Capacitance
7
400
1500 mV p–p
200
1500
8
13
27
MHz
6*
27
12
27
4.5*
27
9
2
15
MHz
fout Output Frequency, REFout
CL = 30 pF
f
Operating Frequency of the Phase Detectors
10, 12
dc
dc
10
MHz
2
MHz
tw Output Pulse Width, φR, φV, LD MC145190 fR in Phase with fV, CL = 50 pF,
11, 12
17
85
ns
MC145191 VPD = 5.5 V, VDD = VCC = 5.0 V
tTLH, Output Transition Times, LD, φV,
tTHL φR — MC145191
CL = 50 pF, VPD = 5.5 V,
VDD = VCC = 5.0 V
11, 12
65
ns
Cin Input Capacitance, REFin
5
pF
*If lower frequency is desired, use wave shaping or higher amplitude sinusoidal signal.
SINE WAVE
GENERATOR
50 *
1000 pF
fin OUTPUT A
1000 pF
Vin
fin
DEVICE
UNDER
TEST
VCC GND VDD
*Characteristic Impedance
TEST
POINT
(fv)
V+
Figure 7. Test Circuit
SINE WAVE
GENERATOR
0.01 µF
REFin OUTPUT A
DEVICE
TEST
POINT
(fR)
Vin
50
UNDER
TEST
REFout
VCC GND VDD
TEST
POINT
V+
Figure 8. Test Circuit — Reference Mode
TEST
REFin OUTPUT A
POINT
C1
DEVICE
(fR)
UNDER
TEST
REFout
C2
VCC GND VDD
V+
Figure 9. Test Circuit — Crystal Mode
REFout
1/f REFout
50%
Figure 10. Switching Waveform
MC145190MC145191
6
MOTOROLA
 

Share Link: 

datasheetbank.com [ Privacy Policy ] [ Request Datasheet ] [ Contact Us ]