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CXK582000TM View Datasheet(PDF) - Sony Semiconductor

Part Name
Description
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CXK582000TM Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
CXK582000TM/YM/M
• Read cycle (WE = “H”)
(Ta = 0 to +70°C)
Item
Symbol
Read cycle time
tRC
Address access time
tAA
Chip enable access time (CE1)
tCO1
Chip enable access time (CE2)
tCO2
Output enable to output valid
tOE
Output hold from address change
tOH
Chip enable to output in low Z (CE1, CE2) tLZ1, tLZ2
Output enable to output in low Z (OE)
tOLZ
Chip disable to output in high Z (CE1, CE2) tHZ1, tHZ2
Output disable to output in high Z (OE)
tOHZ
-85LL
Min. Max.
85 —
— 85
— 85
— 85
— 45
15 —
10 —
5
— 25
— 25
-10LL
Unit
Min. Max.
100 — ns
— 100 ns
— 100 ns
— 100 ns
— 50 ns
15 — ns
10 — ns
5 — ns
— 35 ns
— 35 ns
tHZ1, tHZ2 and tOHZ are defined as the time required for outputs to turn to high impedance state and are not
referred to as output voltage levels.
• Write cycle
(Ta = 0 to +70°C)
Item
Write cycle time
Address valid to end of write
Chip enable to end of write
Data to write time overlap
Data hold from write time
Write pulse width
Address setup time
Write recovery time (WE)
Write recovery time (CE1, CE2)
Output active from end of write
Write to output in high Z
Symbol
tWC
tAW
tCW
tDW
tDH
tWP
tAS
tWR
tWR1
tOW
tWHZ
-85LL
Min. Max.
85 —
65 —
65 —
35 —
0
60 —
0
5
5
10 —
— 25
-10LL
Unit
Min. Max.
100 — ns
70 — ns
70 — ns
45 — ns
0 — ns
70 — ns
0 — ns
5 — ns
5 — ns
10 — ns
— 30 ns
tWHZ is defined as the time required for outputs to turn to high impedance state and is not referred to as
output voltage level.
–5–
 

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