ADR293GRU-REEL View Datasheet(PDF) - Analog Devices
Part Name
Description
View to exact match
ADR293GRU-REEL Datasheet PDF : 11 Pages
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ADR293
WAFER TEST LIMITS (VS = ؉6.0 V, TA = ؉25؇C unless otherwise noted)
Parameter
Symbol
Conditions
Limits
Units
INITIAL ACCURACY
LINE REGULATION
LOAD REGULATION
SUPPLY CURRENT
VO
∆VO/∆VIN
∆VO/∆ ILOAD
IOUT = 0 mA
6.0 V < VIN < 15 V, IOUT = 0 mA
0 mA to 5 mA
No load
4.990/5.010
150
150
15
V
ppm/V
ppm/mA
µA
NOTES
Electrical tests are performed as wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
Specifications subject to change without notice.
DICE CHARACTERISTICS
Die Size 0.074 ؋ 0.052 inch, 3848 sq. mils
(1.88 ؋ 1.32 mm, 2.48 sq. mm)
Transistor Count: 52
VIN
1
4
VOUT(SENSE)
3
VOUT(FORCE)
GND
2
REV. 0
–3–
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