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ADP1046-100-EVALZ View Datasheet(PDF) - Analog Devices

Part Name
Description
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ADP1046-100-EVALZ Datasheet PDF : 96 Pages
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Data Sheet
ADP1046
Parameter
EEPROM RELIABILITY
Endurance1
Data Retention2
Symbol Test Conditions/Comments
TJ = 85°C
TJ = 125°C
TJ = 85°C
TJ = 125°C
Min
Typ
10,000
1000
20
10
Max
Unit
Cycles
Cycles
Years
Years
1 Endurance is qualified as per JEDEC Standard 22, Method A117, and is measured at −40°C, +25°C, +85°C, and +125°C. Endurance conditions are subject to change
pending EEPROM qualification.
2 Retention lifetime equivalent at junction temperature (TJ) = 85°C as per JEDEC Standard 22, Method A117. The derated retention lifetime equivalent at junction
temperature TJ = 125°C is 2.87 years and is subject to change pending EEPROM qualification.
Timing Diagram
SCL
tR
tLOW
tHD;STA
tHD;DAT
SDA
tBUF
P
S
tF
tHIGH
tSU;DAT
tHD;STA
tSU;STA
S
Figure 3. Serial Bus Timing Diagram
tSU;STO
P
Rev. 0 | Page 9 of 96
 

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