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ADC081S021CISD View Datasheet(PDF) - National ->Texas Instruments

Part NameDescriptionManufacturer
ADC081S021CISD Single Channel, 50 to 200 ksps, 8-Bit A/D Converter National-Semiconductor
National ->Texas Instruments National-Semiconductor
ADC081S021CISD Datasheet PDF : 17 Pages
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ADC081S021 Timing Specifications (Continued)
Note 11: Measured with the timing test circuit shown in Figure 1 and defined as the time taken by the output signal to cross 1.0V.
Note 12: Measured with the timing test circuit shown in Figure 1 and defined as the time taken by the output signal to cross 1.0V or 2.0V.
Note 13: tDIS is derived from the time taken by the outputs to change by 0.5V with the timing test circuit shown in Figure 1. The measured number is then adjusted
to remove the effects of charging or discharging the output capacitance. This means that tDIS is the true bus relinquish time, independent of the bus loading.
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