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74LVQ245T View Datasheet(PDF) - STMicroelectronics

Part Name
Description
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74LVQ245T Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
74LVQ245
AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, RL = 500 , Input tr = tf =3 ns)
Symb ol
Parameter
T est Con ditio n
VCC
(V)
Valu e
TA = 25 oC
-40 to 85 oC
Min. T yp. Max. Min. Max.
Unit
tPLH Propagation Delay Time
tPHL
2.7
3.3(*)
7.5 14.0
6.0 10.0
15.0 ns
10.5
tPZL Output Enable Time
tPZH
2.7
3.3(*)
9.5 18.0
7.5 13.0
19.0 ns
13.5
tPLZ Output Disable Time
tPHZ
2.7
3.3(*)
10 20.0
7.5 14.5
21.0 ns
15.0
tOSLH Output to Output Skew
tOSHL Time (note 1, 2)
2.7
3.3(*)
0.5 1.0
0.5 1.0
1.5 ns
1.5
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any twooutputs of the same device switching in the
same direction, either HIGH or LOW (tOSLH = |tPLHm - tPLHn|, tOSHL = |tPHLm - tpHLn|)
2) Parameter guaranteed by design
(*) Voltage range is 3.3V ± 0.3V
CAPACITIVE CHARACTERISTICS
Symb ol
Parameter
Test Conditions
VCC
(V)
Valu e
TA = 25 oC
-40 to 85 oC
Min. T yp. Max. Min. Max.
Unit
CIN Input Capacitance
3.3
5
pF
Ci/o Input/Output Capacitance 3.3
10
pF
CPD Power Dissipation
3.3
Capacitance (note 1)
16
pF
1) CPD isdefined as the value of the IC’sinternal equivalent capacitance which is calculated fromthe operating current consumption without load. (Referto
Test Circuit).Average operting current can be obtained by the following equation. ICC(opr) = CPD VCC fIN + ICC/8(per circuit)
TEST CIRCUIT
TEST
tPLH, tPHL
tPZL, tPLZ
tPZH, tPHZ
CL = 50 pF or equivalent (includes jigand probe capacitance)
RL = R1 = 500orequivalent
RT = ZOUT of pulse generator (typically 50)
4/8
SW IT CH
Open
2VCC
Open
 

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