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74LVQ174TTR_01 View Datasheet(PDF) - STMicroelectronics

Part Name
Description
View to exact match
74LVQ174TTR_01
ST-Microelectronics
STMicroelectronics ST-Microelectronics
74LVQ174TTR_01 Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
74LVQ174
CAPACITIVE CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
VCC
(V)
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
CIN Input Capacitance 3.3
4
pF
CPD Power Dissipation
Capacitance
3.3
fIN = 10MHz
23
pF
(note 1)
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/6 (per flip
flop)
TEST CIRCUIT
CL = 50pF or equivalent (includes jig and probe capacitance)
RL = R1 = 500or equivalent
RT = ZOUT of pulse generator (typically 50)
5/10
 

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