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74LVQ08T View Datasheet(PDF) - STMicroelectronics

Part Name
Description
View to exact match
74LVQ08T
ST-Microelectronics
STMicroelectronics ST-Microelectronics
74LVQ08T Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
74LVQ08
AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, RL = 500 , Input tr = tf =3 ns)
Symb ol
Parameter
T est Con ditio n
VCC
(V)
Valu e
TA = 25 oC
-40 to 85 oC
Min. T yp. Max. Min. Max.
Unit
tPLH Propagation Delay Time
tPHL
2.7
3.3(*)
6.0 12.0
5.0 8.5
13.0 ns
9.0
tOSLH Output to Output Skew
tOSHL Time (note 1, 2)
2.7
3.3(*)
0.5 1.5
0.5 1.5
1.5 ns
1.5
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any twooutputs of the same device switching in the
same direction, either HIGH or LOW (tOSLH = |tPLHm - tPLHn|, tOSHL = |tPHLm - tpHLn|)
2) Parameter guaranteed by design
(*) Voltage range is 3.3V ± 0.3V
CAPACITIVE CHARACTERISTICS
Symb ol
Parameter
Test Conditions
VCC
(V)
Valu e
TA = 25 oC
-40 to 85 oC
Min. T yp. Max. Min. Max.
Unit
CIN Input Capacitance
3.3
4
pF
CPD Power Dissipation
3.3
fIN = 10 MHz
22
pF
Capacitance (note 1)
1) CPD isdefined as the value of the IC’sinternal equivalent capacitance which is calculated fromthe operating current consumption without load. (Referto
Test Circuit).Average operting current can be obtained by the following equation. ICC(opr) = CPD VCC fIN + ICC/4(per gate)
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