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74LV393DB View Datasheet(PDF) - Philips Electronics

Part Name
Description
View to exact match
74LV393DB
Philips
Philips Electronics Philips
74LV393DB Datasheet PDF : 12 Pages
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Philips Semiconductors
Dual 4-bit binary ripple counter
LOGIC DIAGRAM
CP
MR
Q
T FF1
RD
Q
T FF2
RD
Q
T FF3
RD
Product specification
74LV393
Q
T FF4
RD
Q0
Q1
Q2
Q3
SV00677
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNIT
VCC
VI
VO
Tamb
DC supply voltage
Input voltage
Output voltage
Operating ambient temperature range in free
air
See Note 1
See DC and AC
characteristics
1.0
3.3
3.6
V
0
VCC
V
0
VCC
V
–40
–40
+85
+125
°C
tr, tf
Input rise and fall times
VCC = 1.0V to 2.0V
VCC = 2.0V to 2.7V
VCC = 2.7V to 3.6V
500
200
ns/V
100
NOTES:
1. The LV is guaranteed to function down to VCC = 1.0V (input levels GND or VCC); DC characteristics are guaranteed from VCC = 1.2V to VCC =3.6V.
ABSOLUTE MAXIMUM RATINGS1, 2
In accordance with the Absolute Maximum Rating System (IEC 134).
Voltages are referenced to GND (ground = 0V).
SYMBOL
PARAMETER
CONDITIONS
VCC
±IIK
±IOK
±IO
DC supply voltage
DC input diode current
DC output diode current
DC output source or sink current
– standard outputs
VI < –0.5 or VI > VCC + 0.5V
VO < –0.5 or VO > VCC + 0.5V
–0.5V < VO < VCC + 0.5V
RATING
–0.5 to +4.6
20
50
25
UNIT
V
mA
mA
mA
±IGND,
±ICC
DC VCC or GND current for types with
– standard outputs
50
mA
Tstg
Storage temperature range
–65 to +150
°C
Power dissipation per package
for temperature range: –40 to +125°C
PTOT
– plastic DIL
– plastic mini-pack (SO)
above +70°C derate linearly with 12 mW/K
750
above +70°C derate linearly with 8 mW/K
500
mW
– plastic shrink mini-pack (SSOP and TSSOP) above +60°C derate linearly with 5.5 mW/K
400
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
1998 Jun 10
4
 

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