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74ALVCH16374DL,112 View Datasheet(PDF) - NXP Semiconductors.

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74ALVCH16374DL,112 Datasheet PDF : 17 Pages
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NXP Semiconductors
Table 8. Measurement points
Supply voltage
Input
VCC
VI
2.3 V to 2.7 V and < 2.3 V VCC
2.7 V
2.7 V
3.0 V to 3.6 V
2.7 V
12. Test information
74ALVCH16374
2.5 V/3.3 V 16-bit edge-triggered D-type flip-flop; 3-state
VM
0.5 VCC
1.5 V
1.5 V
Output
VM
0.5 VCC
1.5 V
1.5 V
VX
VOL + 0.15 V
VOL + 0.3 V
VOL + 0.3 V
VY
VOH 0.15 V
VOH 0.3 V
VOH 0.3 V
VI
G
VCC
VO
DUT
RT
VEXT
RL
CL
RL
mna616
Fig 9.
Test data is given in Table 9.
Definitions for test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
VEXT = External voltage for measuring switching times.
Load circuit for measuring switching times
Table 9. Test data
Supply voltage
VCC
2.3 V to 2.7 V and
< 2.3 V
2.7 V
3.0 V to 3.6 V
Input
VI
VCC
2.7 V
2.7 V
tr, tf
2.0 ns
2.5 ns
2.5 ns
Load
CL
30 pF
50 pF
50 pF
RL
500
500
500
VEXT
tPLH, tPHL
open
tPLZ, tPZL
2 VCC
tPHZ, tPZH
GND
open
open
2 VCC
2 VCC
GND
GND
74ALVCH16374
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 5 — 9 July 2012
© NXP B.V. 2012. All rights reserved.
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