Q5962F9563003QYC View Datasheet(PDF) -

HS-1840ARH, HS-1840BRH

Burn-In/Life Test Circuits

+VS

GND

F4

1

2

R

3

4

5

6

7

8

9

10

11

12

13

14

R

28

27

-VS

26

R

25

24

23

22

21

20

19

18

F5

17

F1

16

F2

15

F3

+VS

GND

VR

1

2

R3

4

5

6

7

8

9

10

11

12

13

14

R

R

28

27

-VS

26

R

25

24

23

22

21

20

19

18

17

16

15

NOTE:

VS+ = +15.5V ±0.5V, VS- = -15.5V ±0.5V.

R = 1kΩ ±5%.

C1 = C2 = 0.01µF ±10%, 1 EACH PER SOCKET, MINIMUM.

D1 = D2 = 1N4002, 1 EACH PER BOARD, MINIMUM.

INPUT SIGNALS:

SQUARE WAVE, 50% DUTY CYCLE, 0V TO 15V PEAK ±10%.

F1 = 100kHz; F2 = F1/2; F3 = F1/4; F4 = F1/8; F5 = F1/16.

FIGURE 1. DYNAMIC BURN-IN AND LIFE TEST CIRCUIT

NOTES:

1. The above test circuits are utilized for all package types.

2. The Dynamic Test Circuit is utilized for all life testing.

NOTE:

R = 1kΩ ±5%, 1/4W.

C1 = C2 = 0.01µF MINIMUM, 1 EACH PER SOCKET, MINIMUM.

VS+ = 15.5V ±0.5V, VS- = -15.5V ±0.5V, VR = 15.5 ±0.5V

FIGURE 2. .STATIC BURN-IN TEST CIRCUIT

Irradiation Circuit

+15V

NC

NC

+1V

+5V

HS-1840ARH, HS-1840BRH

1

28

2

27

3

26

4

25

5

24

6

23

7

22

8

21

9

20

10

19

11

18

12

17

13

16

14

15

-15V 1kΩ

NOTE:

3. All irradiation testing is performed in the 28 lead CERDIP package.

4

FN4355.3

September 14, 2010

Share Link: