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74ALVCH16244 View Datasheet(PDF) - Philips Electronics

Part Name
Description
View to exact match
74ALVCH16244
Philips
Philips Electronics Philips
74ALVCH16244 Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
Philips Semiconductors
16-bit buffer/line driver (3-State)
Product specification
74ALVC16244/
74ALVCH16244
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
VCC
VI
VO
Tamb
tr, tf
DC supply voltage 2.5V range (for max. speed
performance @ 30 pF output load)
DC supply voltage 3.3V range (for max. speed
performance @ 50 pF output load)
DC supply voltage (for low-voltage applications)
DC Input voltage range
DC output voltage range
Operating free-air temperature range
Input rise and fall times
For data input pins with
bus hold
For data input pins without
bus hold
For control pins
VCC = 2.3 to 3.0V
VCC = 3.0 to 3.6V
LIMITS
MIN
MAX
2.3
2.7
3.0
3.6
1.2
3.6
0
VCC
0
5.5
0
5.5
0
VCC
–40
+85
0
20
0
10
UNIT
V
V
V
°C
ns/V
ABSOLUTE MAXIMUM RATINGS1
In accordance with the Absolute Maximum Rating System (IEC 134)
Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
VCC
DC supply voltage
IIK
DC input diode current
VI
DC input voltage
VI t0
For data inputs with bus hold2
For data inputs without bus hold2
For control pins2
–0.5 to +4.6
V
–50
mA
–0.5 to VCC +0.5
–0.5 to +5.5
V
–0.5 to +5.5
IOK
DC output diode current
VO uVCC or VO t 0
"50
mA
VO
DC output voltage
Note 2
–0.5 to VCC +0.5
V
IO
DC output source or sink current
VO = 0 to VCC
"50
mA
IGND, ICC DC VCC or GND current
"100
mA
Tstg
Storage temperature range
–65 to +150
°C
Power dissipation per package
For temperature range: –40 to +125 °C
PTOT
–plastic medium-shrink (SSOP)
above +55°C derate linearly with 11.3 mW/K
850
mW
–plastic thin-medium-shrink (TSSOP) above +55°C derate linearly with 8 mW/K
600
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
1998 Jun 29
4
 

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