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JAN1N4101CURTR-1 View Datasheet(PDF) - Microsemi Corporation

Part Name
Description
View to exact match
JAN1N4101CURTR-1
Microsemi
Microsemi Corporation Microsemi
JAN1N4101CURTR-1 Datasheet PDF : 3 Pages
1 2 3
SCOTTSDALE DIVISION
1N4099UR thru 1N4135UR
(or MLL4099 thru MLL4135)
and
1N4614UR thru 1N4627UR
(or MLL4614 thru MLL4627)
GRAPHS and CIRCUIT
FIGURE 1 Noise Density Measurement Circuit
Noise density, (ND) is specified in microvolt-rms per squre-
root-hertz. Actual measurement is performed using a 1 KHz
to 3 KHz frequency bandpass filter at a constant Zener test
current (IZT) AT 25oC ambient temperature. ND is calculated
from the formula.
TEC
TA
TEC, End Cap Temperature (oC) or TA
Ambient temperature on FR4 PC board
FIGURE 2 Power Derating Curve
Capacitance vs. VZ Curve
FIGURE 3 Capacitance vs. Zener Voltage (Typical)
PACKAGE DIMENSIONS
Zener Voltage VZ
INCHES
MILLIMETERS
DIM MIN MAX MIN MAX
A 0.063 0.067 1.60 1.70
B 0.130 0.146 3.30 3.70
C 0.016 0.022 0.41 0.55
PAD LAYOUT
INCHES
mm
A
.200
5.08
B
.055
1.40
C
.080
2.03
Copyright 2002
11-05-03 REV C
Microsemi
Scottsdale Division
8700 E. Thomas Rd. PO Box 1390, Scottsdale, AZ 85252 USA, (480) 941-6300, Fax: (480) 947-1503
Page 3
 

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