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F1004 View Datasheet(PDF) - Texas Instruments

Part NameDescriptionManufacturer
F1004 4-Channel Capacitance-to-Digital Converter for Capacitive Sensing Solutions TI
Texas Instruments TI
F1004 Datasheet PDF : 33 Pages
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FDC1004
SNOSCY5B – AUGUST 2014 – REVISED APRIL 2015
www.ti.com
7.5 Electrical Characteristics(1)
Over recommended operating temperature range, VDD = 3.3 V, for TA = 25°C (unless otherwise noted).
PARAMETER
TEST CONDITION
MIN (2)
TYP (3)
POWER SUPPLY
IDD
Supply current
Conversion mode; Digital input to
750
VDD or GND
Standby; Digital input to VDD or
29
GND
CAPACITIVE INPUT
ICR
Input conversion range
±15
COMAX
RES
EON
Max input offset capacitance
Effective resolution (4)
Output noise
per channel, Series resistance at
CINn n=1.4 = 0 Ω
Sample rate = 100S/s (5)
Sample rate = 100S/s (5)
100
16
33.2
ERR
Absolute error
after offset calibration
±6
TcCOFF
GERR
tcG
Offset deviation over temperature
Gain error
Gain drift vs. temperature
-40°C < T < 125°C
-40°C < T < 125°C
46
0.2
-37.5
PSRR
DC power supply rejection
3 V < VDD < 3.6 V, single-ended
13.6
mode (channel vs GND)
CAPDAC
FRCAPDAC Full-scale range
TcCOFFCAP Offset drift vs. temperature
DAC
EXCITATION
-40°C < T < 125°C
96.9
30
ƒ
Frequency
25
VAC
AC voltage across capacitance
2.4
VDC
Average DC voltage across
1.2
capacitance
SHIELD
DRV
Driver capability
ƒ = 25 kHz, SHLDn to GND, n = 1,2
MAX(2) UNIT
950
µA
70
µA
pF
pF
bit
aF/Hz
fF
fF
%
ppm/°C
fF/V
pF
fF
kHz
Vpp
V
400
pF
(1) Electrical Characteristics Table values apply only for factory testing conditions at the temperature indicated. Factor testing conditions
result in very limited self-heating of the device such that TJ=TA. No guarantee of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where TJ>TA. Absolute Maximum Ratings indicate junction temperature limits beyond
which the device may be permanently degraded, either mechanically or electrically.
(2) Limits are ensured by testing, design, or statistical analysis at 25Degree C. Limits over the operating temperature range are ensured
through correlations using statistical quality control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not guaranteed on
shipped production material.
(4) Effective resolution is the ratio of converter full scale range to RMS measurement noise.
(5) No external capacitance connected.
7.6 I2C Interface Voltage Level
Over recommended operating free-air temperature range, VDD = 3.3 V, for TA = TJ = 25°C (unless otherwise noted).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
VIH
VIL
VOL
HYS
Input high voltage
Input low voltage
Output low voltage
Hysteresis (1)
Sink current 3 mA
0.7*VDD
0.1*VDD
0.3*VDD
0.4
(1) This parameter is specified by design and/or characterization and is not tested in production.
UNIT
V
V
V
V
6
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