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ST75285 View Datasheet(PDF) - STMicroelectronics

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Description
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ST75285
ST-Microelectronics
STMicroelectronics ST-Microelectronics
ST75285 Datasheet PDF : 13 Pages
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ST75285
RECOMMENDED OPERATING CONDITIONS
Symbol
VDD
VSS
VCC
VI
IOH
Parameter
Supply Voltage
Supply Voltage
Supply Voltage
Driver Input Voltage
High Level Output Current
IOL
Low Level Output Current
TA
Operating Free-Air Tempereature
Min
7.5
-7.5
4.5
0
DRIVER
RECEIVER
DRIVER
RECEIVER
0
Max
Unit
15
V
-15
V
5.5
V
VCC
V
-6
mA
-0.5
6
mA
16
70
°C
SUPPLY CURRENTS
Symbol
Parameter
IDD Supply Current from VDD
ISS Supply Current from VSS
ICC Supply Current from VCC
Test Conditions
VDD
VSS
9
-9
No load.
12
-12 All inputs at
15
-15
1.9V
9
-9
No load.
12
-12 All inputs at
15
-15
0.8V
9
-9
No load.
12
-12 All inputs at
15
-15
1.9V
9
-9
No load.
12
-12 All inputs at
15
-15
0.8V
No load. All inputs at 5V
VCC = 5V
Min.
Value
Typ.
Max.
22
28
32
9
11
12
-22
-28
-32
-6.4
-6.4
-6.4
60
Unit
mA
mA
mA
mA
mA
DRIVER ELECTRICAL CHARACTERISTICS OVER OPERATING FREE-AIR TEMPERATURE
RANGE (VDD = 9V, VSS = -9V, VCC = 5V, unless otherwise specified)
Symbol
Parameter
Test Conditions
Value
Unit
Min. Typ. Max.
VOH High Level Output Voltage VIL = 0.8 V RL = 3K(See Figure 1)
VOL Low Level Output Voltage VIH = 1.9 V RL = 3K(See Figure 1)
(Note 3)
6
7.5
V
-7.5
-6
V
IIH High Level Input Current VI = 5 V (See Figure 2)
10
µA
IIL Low Level Input Current VI = 0 V (See Figure 2)
1.6 mA
IOS(H) High Level Short Circuit
Output Current (Note 4)
VIL = 0.8 V VO = 0 V (See Figure 1)
-4.5 12 19.5 mA
IOS(L) Low Level Short Circuit
Output Current
VIH = 2 V VO = 0 V (See Figure 1)
4.5
12
19.5 mA
RO Output Resistance
VDD = VSS = VCC = 0 V
300
VO = -2 to 2 V (Note 5)
NOTE 3: The algebraic convention, where the more positive (less negative) limits designated as maximum, is used in this datasheet for logic
levels only (e.g. if - 10V is a maximum, the typical value is a more negative voltage).
NOTE 4: Output short circuit conditions must maintain the total power dissipation below absolute maximum ratings.
NOTE 5: Test conditions are those specified by EIA-232-E and as listed above.
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