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PBHV9050T View Datasheet(PDF) - NXP Semiconductors.

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PBHV9050T Datasheet PDF : 12 Pages
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NXP Semiconductors
8. Test information
PBHV9050T
500 V, 150 mA PNP high-voltage low VCEsat (BISS) transistor
VBB
VCC
(probe)
oscilloscope
450
VI
RB
R2
R1
Fig 11. Test circuit for switching times
RC
Vo (probe)
oscilloscope
450
DUT
mgd624
8.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is
suitable for use in automotive applications.
9. Package outline
2.5 1.4
2.1 1.2
3.0
2.8
3
1.1
0.9
0.45
0.15
1
1.9
Dimensions in mm
Fig 12. Package outline SOT23 (TO-236AB)
2
0.48
0.38
0.15
0.09
04-11-04
10. Packing information
PBHV9050T_1
Product data sheet
Table 8. Packing methods
The indicated -xxx are the last three digits of the 12NC ordering code.[1]
Type number Package Description
PBHV9050T SOT23 4 mm pitch, 8 mm tape and reel
Packing quantity
3 000
10 000
-215
-235
[1] For further information and the availability of packing methods, see Section 14.
Rev. 01 — 16 September 2009
© NXP B.V. 2009. All rights reserved.
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