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ISL71090SEHVF25 View Datasheet(PDF) - Intersil

Part Name
Description
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ISL71090SEHVF25 Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
Radiation Hardened Ultra Low Noise, Precision Voltage
Reference
ISL71090SEH25
The ISL71090SEH25 is an ultra low noise, high DC accuracy
precision voltage reference with a wide input voltage range
from 4V to 30V. The ISL71090SEH25 uses the Intersil
Advanced Bipolar technology to achieve sub 2µVP-P 0.1Hz
noise with an accuracy over temperature and radiation of
0.15%.
The ISL71090SEH25 offers a 2.5V output voltage with
10ppm/°C temperature coefficient and also provides
excellent line and load regulation. The device is offered in an
8 Ld Flatpack package.
The ISL71090SEH25 is ideal for high-end instrumentation,
data acquisition and applications requiring high DC precision
where low noise performance is critical.
Applications
• RH voltage regulators precision outputs
• Precision voltage sources for data acquisition system for
space applications
• Strain and pressure gauge for space applications
Features
• Reference output voltage . . . . . . . . . . . . . . . . . . .2.5V±0.05%
• Accuracy over temperature and radiation . . . . . . . . . .±0.15%
• Output voltage noise . . . . . . . . . . 2µVP-P Typ (0.1Hz to 10Hz)
• Supply current . . . . . . . . . . . . . . . . . . . . . . . . . . . . 930µA (Typ)
• Tempco (box method) . . . . . . . . . . . . . . . . . . . 10ppm/°C Max
• Output current capability . . . . . . . . . . . . . . . . . . . . . . . . 20mA
• Line regulation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8ppm/V
• Load regulation . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.5ppm/mA
• Operating temperature range. . . . . . . . . . . .-55°C to +125°C
• Radiation environment
- High dose rate (50-300rad(Si)/s) . . . . . . . . . . . 100krad(Si)
- Low dose rate (0.01rad(Si)/s) . . . . . . . . . . . . . 100krad(Si)*
- SET/SEL/SEB . . . . . . . . . . . . . . . . . . . . . . . . 86MeVcm2/mg
*Product capability established by initial characterization. The
“EH” version is acceptance tested on a wafer by wafer basis to
50krad(Si) at low dose rate
• Electrically screened to SMD 5962-13211
Related Literature
AN1847, “ISL71090SEH25 Evaluation Board User’s Guide”
AN1848, “SEE Testing of the ISL71090SEH25”
AN1849, “Radiation Report of the ISL71090SEH25”
ISL71090SEH25
1
8
2
VIN
0.1µF
3
4
7
VREF
6
5
1µF
C
REFIN DACOUT
VDD
VDD
D12
VEE
VEE
D0
1.1k
NOTE: Select C to minimize
settling time.
BIPOFF
GND
HS-565BRH
FIGURE 1. ISL71090SEH25 TYPICAL APPLICATION DIAGRAM
2.503
2.502
2.501
2.500
2.499
2.498
2.497
-55
2.5V +0.1%
UNIT4
UNIT3
UNIT2
UNIT1
UNIT5
2.5V -0.1%
-5
45
95
145
TEMPERATURE (°C)
FIGURE 2. VOUT vs TEMPERATURE
June 6, 2013
1
FN8451.0
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774 | Copyright Intersil Americas LLC 2013. All Rights Reserved
Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries.
All other trademarks mentioned are the property of their respective owners.
 

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