H27UAG8T2B View Datasheet(PDF) - Hynix Semiconductor
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H27UAG8T2B Datasheet PDF : 61 Pages
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Release
H27UAG8T2B Series
16Gb (2048M x 8bit) NAND Flash
1.10. Bad Block Replacement
This device may have the invalid blocks when shipped from factory. An invalid block is one that contains one or more
bad bits. Over the lifetime of the device additional Bad Blocks may develop. In this case, the block has to be replaced
by copying the data to a valid block. These additional Bad Blocks can be identified as attempts to program or erase
them will give errors in the Status Register.
The failure of a page program operation does not affect the data in other pages in the same block. Bad block can be
replaced by re-programming the current data and copying the rest of the replaced block to an available valid block.
Refer to Table 2 (block failure) and Figure 5 (Block replacement) for the recommended procedure to follow if an error
occurs during an operation.
Table 2. Block failure
Operation
Erase
Program
Read
Recommended Procedure
Block Replacement
Block Replacement
ECC
■ Figure 5. Block replacement
1st Page
Block A
Data
Nth Page
Failure
FFh
Block B
(2)
1st Page
Data
(3)
Nth Page
FFh
Buffer memory
Controller
Notes:
1. An error occurs on nth page of the Block A during Program or Erase operation.
2. Data in Block A is copied to same location in Block B which is valid block.
3. Nth page of block A which is in controller buffer memory is copied into nth page of Block B.
4. Bad block table should be updated to prevent from erasing or programming Block A.
Rev 1.0 / Aug. 2010
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