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93C86 View Datasheet(PDF) - Catalyst Semiconductor => Onsemi

Part Name
Description
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93C86
Catalyst
Catalyst Semiconductor => Onsemi Catalyst
93C86 Datasheet PDF : 9 Pages
1 2 3 4 5 6 7 8 9
93C46/56/57/66/86
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias ................. –55°C to +125°C
Storage Temperature ....................... –65°C to +150°C
Voltage on any Pin with
Respect to Ground(1) ............ –2.0V to +VCC +2.0V
VCC with Respect to Ground ............... –2.0V to +7.0V
Package Power Dissipation
Capability (Ta = 25°C) ................................... 1.0W
Lead Soldering Temperature (10 secs) ............ 300°C
Output Short Circuit Current(2) ........................ 100 mA
RELIABILITY CHARACTERISTICS
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
reliability.
Symbol
Parameter
Min.
Max.
NEND(3)
Endurance
1,000,000
TDR(3)
Data Retention
100
VZAP(3)
ESD Susceptibility
2000
ILTH(3)(4)
Latch-Up
100
D.C. OPERATING CHARACTERISTICS
VCC = +1.8V to +6.0V, unless otherwise specified.
Symbol
ICC1
ICC2
ISB1
ISB2(5)
ILI
ILO
VIL1
VIH1
VIL2
VIH2
VOL1
VOH1
VOL2
VOH2
Parameter
Power Supply Current
(Operating Write)
Power Supply Current
(Operating Read)
Power Supply Current
(Standby) (x8 Mode)
Power Supply Current
(Standby) (x16Mode)
Input Leakage Current
Output Leakage Current
(Including ORG pin)
Input Low Voltage
Input High Voltage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
Min.
-0.1
2
0
VCCX0.7
2.4
VCC-0.2
Units
Cycles/Byte
Years
Volts
mA
Reference Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
Limits
Typ.
Max.
3
500
10
0
1
1
0.8
VCC+1
VCCX0.2
VCC+1
0.4
0.2
Units
mA
µA
µA
µA
µA
µA
V
V
V
V
V
V
V
Test Conditions
fSK = 1MHz
VCC = 5.0V
fSK = 1MHz
VCC = 5.0V
CS = 0V
ORG=GND
CS=0V
ORG=Float or VCC
VIN = 0V to VCC
VOUT = 0V to VCC,
CS = 0V
4.5VVCC<5.5V
1.8VVCC<2.7V
4.5VVCC<5.5V
IOL = 2.1mA
IOH = -400µA
1.8VVCC<2.7V
IOL = 1mA
IOH = -100µA
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is VCC +0.5V, which may overshoot to VCC +2.0V for periods of less than 20 ns.
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to VCC +1V.
(5) Standby Current (ISB2)=0µA (<900nA) for 93C46/56/57/66, (ISB2)=2µA for 93C86.
Doc. No. 25056-00 2/98 M-1
2
 

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