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CAT28F001N-12TT View Datasheet(PDF) - Catalyst Semiconductor => Onsemi

Part Name
Description
View to exact match
CAT28F001N-12TT
Catalyst
Catalyst Semiconductor => Onsemi Catalyst
CAT28F001N-12TT Datasheet PDF : 18 Pages
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CAT28F001
SUPPLY CHARACTERISTICS
Symbol
Parameter
Limits
Min
Max.
Unit
VLKO
VCC Erase/Write Lock Voltage
2.5
V
VCC
VCC Supply Voltage
4.5
5.5
V
VPPL
VPP During Read Operations
0
6.5
V
VPPH
VPP During Erase/Program
11.4
12.6
V
VHH
RP, OE Unlock Voltage
11.4
12.6
V
A.C. CHARACTERISTICS, Read Operation
VCC = +5V ±10%, unless otherwise specified
JEDEC Standard
Symbol Symbol
Parameter
tAVAV
tRC
Read Cycle Time
28F001-70(8) 28F001-90(7)
Min. Max. Min. Max.
70
90
28F001-12(7) 28F001-15(7)
Min. Max. Min. Max. Unit
120
150
ns
tELQV
tAVQV
tGLQV
tCE
CE Access Time
tACC
Address Access Time
tOE
OE Access Time
70
90
70
90
27
35
120
150 ns
120
150 ns
50
55
ns
-
tGLQX
tELQX
tGHQZ
tEHQZ
tOH
Output Hold from Address OE/CE Change 0
0
0
0
ns
tOLZ(1)(6) OE to Output in Low-Z
0
0
0
0
ns
tLZ(1)(6)
CE to Output in Low-Z
0
0
0
0
ns
tDF(1)(2) OE High to Output High-Z
30
30
30
30
ns
tHZ(1)(2) CE High to Output High-Z
55
35
55
55
ns
tPHQV
tPWH
RP High to Output Delay
600
600
600
600 ns
Figure 1. A.C. Testing Input/Output Waveform(3)(4)(5)
2.4 V
0.45 V
INPUT PULSE LEVELS
2.0 V
0.8 V
REFERENCE POINTS
Testing Load Circuit (example)
5108 FHD F03
1.3V
Figure 2. Highspeed A.C. Testing Input/Output
Waveform(3)(4)(5)
3.0 V
0.0 V
INPUT PULSE LEVELS
1.5 V
REFERENCE POINTS
Testing Load Circuit (example)
5108 FHD F03A
1.3V
1N914
1N914
DEVICE
UNDER
TEST
3.3K
OUT
CL = 100 pF
CL INCLUDES JIG CAPACITANCE
DEVICE
UNDER
TEST
3.3K
CL = 30 pF
OUT
CL INCLUDES JIG CAPACITANCE
5108 FHD F04
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) Output floating (High-Z) is defined as the state where the external data line is no longer driven by the output buffer.
(3) Input Rise and Fall Times (10% to 90%) < 10 ns.
(4) Input Pulse Levels = 0.45V and 2.4V. For High Speed Input Pulse Levels 0.0V and 3.0V.
(5) Input and Output Timing Reference = 0.8V and 2.0V. For High Speed Input and Output Timing Reference = 1.5V.
(6) Low-Z is defined as the state where the external data may be driven by the output buffer but may not be valid.
(7) For load and reference points, see Fig. 1
(8) For load and reference points, see Fig. 2
5108 FHD F05
5
Doc. No. 25071-00 2/98 F-1
 

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