|LM311PWLE Datasheet PDF : 28 Pages |
LM111, LM211, LM311
DIFFERENTIAL COMPARATORS WITH STROBES
D Fast Response Times
D Strobe Capability
D Maximum Input Bias Current . . . 300 nA
D Maximum Input Offset Current . . . 70 nA
LM111 . . . JG PACKAGE
LM211 . . . D, P, OR PW PACKAGE
LM311 . . . D, P, PS, OR PW PACKAGE
EMIT OUT 1
7 COL OUT
SLCS007H − SEPTEMBER 1973 − REVISED AUGUST 2003
D Can Operate From Single 5-V Supply
D Available in Q-Temp Automotive
− High-Reliability Automotive Applications
− Configuration Control/Print Support
− Qualification to Automotive Standards
LM111 . . . FK PACKAGE
3 2 1 20 19
17 COL OUT
9 10 11 12 13
NC − No internal connection
The LM111, LM211, and LM311 are single high-speed voltage comparators. These devices are designed to
operate from a wide range of power-supply voltages, including ±15-V supplies for operational amplifiers and
5-V supplies for logic systems. The output levels are compatible with most TTL and MOS circuits. These
comparators are capable of driving lamps or relays and switching voltages up to 50 V at 50 mA. All inputs and
outputs can be isolated from system ground. The outputs can drive loads referenced to ground, VCC+ or VCC−.
Offset balancing and strobe capabilities are available, and the outputs can be wire-OR connected. If the strobe
is low, the output is in the off state, regardless of the differential input.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright © 2003, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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