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K40T1202 View Datasheet(PDF) - Infineon Technologies

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K40T1202 Datasheet PDF : 15 Pages
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IKW40N120T2
TrenchStop® 2nd Generation Series
600ns
500ns
400ns
TJ=175°C
300ns
200ns
100ns
TJ=25°C
0ns
400A/µs 800A/µs 1200A/µs 1600A/µs
diF/dt, DIODE CURRENT SLOPE
Figure 23. Typical reverse recovery time as a
function of diode current slope
(VR=600V, IF=40A,
Dynamic test circuit in Figure E)
8µC
TJ=175°C
6µC
4µC
TJ=25°C
2µC
0µC
400A/µs
800A/µs 1200A/µs 1600A/µs
diF/dt, DIODE CURRENT SLOPE
Figure 24. Typical reverse recovery charge as
a function of diode current slope
(VR=600V, IF=40A,
Dynamic test circuit in Figure E)
40A
35A
TJ=175°C
30A
TJ=25°C
25A
20A
15A
10A
5A
0A
400A/µs 800A/µs 1200A/µs 1600A/µs
diF/dt, DIODE CURRENT SLOPE
Figure 25. Typical reverse recovery current as
a function of diode current slope
(VR=600V, IF=40A,
Dynamic test circuit in Figure E)
-1000A/µs
-800A/µs
-600A/µs
TJ=25°C
TJ=175°C
-400A/µs
-200A/µs
-0A/µs
400A/µs 800A/µs 1200A/µs 1600A/µs
diF/dt, DIODE CURRENT SLOPE
Figure 26. Typical diode peak rate of fall of
reverse recovery current as a
function of diode current slope
(VR=600V, IF=40A,
Dynamic test circuit in Figure E)
IFAG IPC TD VLS
11
Rev. 2.4 23.09.2014
 

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