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MAX785 View Datasheet(PDF) - Maxim Integrated

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MAX785
MaximIC
Maxim Integrated MaximIC
MAX785 Datasheet PDF : 24 Pages
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Product Reliability Report
________________________Fabrication Processes
Maxim is currently running the following seven
major fabrication processes:
SMG (Standard Metal-Gate CMOS)
MV1 (Medium-Voltage Metal-Gate CMOS)
MV2 (Medium-Voltage Silicon-Gate CMOS)
SG3 (3-Micron Silicon-Gate CMOS)
SG5 (5-Micron Silicon-Gate CMOS)
SG1.2 (1.2-Micron Silicon-Gate CMOS)
Bipolar (18/12-Micron)
SMG
SMG is a 6-micron, 24V, metal-gate CMOS
process. It has conservative design rules, but is
appropriate for many SSI and MSI circuit designs.
This very popular fabrication process is used to
produce many of Maxim’s products.
MV1
MV1 is a 12-micron, 44V, metal-gate CMOS
process, used exclusively to produce our analog
switch product line.
MV2
MV2 is a 5-micron, 44V, silicon-gate CMOS process,
also used in our analog switch production line.
SG3, SG5, and SG1.1
SG3 is a 3-micron, 12V, silicon-gate CMOS process.
SG5 is a 5-micron, 20V, silicon-gate CMOS process.
SG1.2 is a 1.2-micron, 6V, silicon-gate CMOS
process. SG3, SG5, and SG1.2 have become our
future process standards.
Bipolar
Bipolar is an 18-micron, 44V or 12-micron, 24V bipo-
lar process, used chiefly for precision references, op
amps, and A/D converters.
_______________________Reliability Methodology
Maxim’s quality approach to reliability testing is con-
servative. Each of the seven fabrication processes
has been qualified using the following industry-stan-
dard tests: Life Test, 85/85, Pressure Pot, HAST, High-
Temperature Storage Life, and Temperature Cycling
(Table 1). Each process has been qualified and
proven to produce inherently high-quality product.
Maxim’s early conservative approach included
burn-in as a standard stage of our production flow.
Burn-in ensured that our customers were receiving
a quality product. Now, with the addition of our own
sophisticated fabrication facility, we have improved
the innate product quality to the point where burn-
in adds little reliability value.
Each time a new fabrication process is introduced at
Maxim, an Infant Mortality evaluation (burn-in evalu-
ation) is initiated at the same time as process qualifi-
cation. Through this Infant Mortality evaluation we
can identify fabrication process defects at an early
stage of production. Using the data in Table 2 (Infant
Mortality Evaluation Results) and Figure 9 (Infant
Mortality Pareto Chart) we can identify which cate-
gory should next be improved. The data shown
demonstrates the positive direction of Maxim’s quali-
ty standards. It illustrates our continued dedication
to providing the lowest overall-cost solution to our
customers, through superior quality products.
Maxim’s SMG, MV1, MV2, SG3, SG5, SG1.2, and
Bipolar processes clearly meet or exceed the per-
formance and reliability expectations of the semi-
conductor industry. These processes are qualified
for production. Cross-sectional views of these
seven processes are shown in Figures 1–7.
___________________________Reliability Program
TABLE 1. MAXIM PROCESS RELIABILITY TESTS
TEST NAME
Life Test
85/85
Pressure Pot
Temperature
Cycling
High-Temp.
Storage Life
CONDITIONS
+135°C/1000 hrs.
+85°C, 85% R.H.,
1000 hrs. with Bias
+121°C, 100% R.H.,
2 ATM, 168 hrs.
-65°C to +150°C
Air-to-Air/1000
Cycling
+150°C/1000 hrs.
SAMPLING PLAN
ACC/SS
1/77
1/77
0/77
1/77
1/77
Maxim has implemented a series of Quality and
Reliability programs aimed at building the highest
quality, most reliable analog products in the industry.
Reliability Program Steps
All products, processes, packages, and changes in
______________________________________________________________________________________ 3
 

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