MAX785 View Datasheet(PDF) - Maxim Integrated
Part Name
Description
View to exact match
MAX785 Datasheet PDF : 24 Pages
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Product Reliability Report
PRODUCT
DG201ACJ
DG211CJ
DG212CJ
DG509ACJ
DG508ACJ
DG508ACJ
Subtotals
DG411DY
Subtotals
ICM7218CIPI
ICM7218AIPI
ICM7218BIPI
Subtotals
ICM7218AIPI
ICM7218BIPI
Subtotals
MAX1232CPA
Subtotals
MAX232CPE
MAX232CPE
MAX202CPE
MAX232CPE
Subtotals
MAX690CPA
Subtotals
MAX1044CPA
Subtotals
LOT
XRCAAB184C
XRCAAB217Q
XRCBAA208Q
XROCAA045Q
XROBAB029Q
XROBAC030Q
XRLADB016A
XRLADB017B
XRLADB018B
XDDCAA096A
XDDCAA102A
XDDAAA097A
XDDAAA098A
XDDBAA099B
BDDACZ012Q
BDDACA015B
BDDBCZ010Q
XPPAJQ003BR
XPPAJQ003C
XPPAJQ006A
XPPAJQ007B
XPWAAA039AA
XPWAAA040AA
XPWAAA044AB
XPWAAA048AB
XPWAAA050AA
XPWAAA074AA
XPWAAA147A
XPWAAA147B
XPWBAA012A
XPWBAA012B
XKMAAA005Q
XKMCAA007A
XKMAAA008A
XPYAJA208A
XPYAJA208BA
XPYAJA209A
XPYAJA208B
NEAABZ003B
NEAAVN020B
NEAABZ003A
TABLE 2. INFANT MORTALITY EVALUATION RESULTS
BI TEMP (°C)
SS FAILURES PPM
ANALYSIS
MV1 PROCESS
135
11,698
1
85 1-MARGINAL LEAKAGE
135
9642
4
414 4-MARGINAL LEAKAGE
135
11,834
2
169 2-MARGINAL LEAKAGE
135
12,629
11
871 7-ISOFF CONTAMINATION, 1-HIGH ICC, 3 TIMING
135
10,216
2
195 1-IDON, IDOFF
135
7912
0
0
63,931
20
312.8
MV2 PROCESS
135
10,338
1
97 1-MARGINAL LEAKAGE
135
10,482
0
0
135
10,068
2
199 2-MARGINAL LEAKAGE
30,888
3
97
SMG PROCESS
135
6886
0
0.0
135
6824
2
293 1-MARGINAL LEAKAGE, 1-UNKNOWN
135
6694
0
0.0
135
6927
0
0.0
135
6959
0
0.0
34,290
2
58.3
135
11,674
1
85 1-UNKNOWN
135
3101
1
322 1-UNKNOWN
135
12,355
1
80 1-UNKNOWN
27,130
3
110
135
844
0
0.0
135
6447
2
310 1-DIE SCRATCH, 1-PACKAGE CRACK
135
12,390
0
0.0
135
13,330
0
0.0
33,011
2
60.6
150
5324
0
0.0
150
5627
1
177.7 1-INTERMITTENT BOND WIRE OPEN (HEEL OF WEDGE BOND)
150
5831
0
0.0
125
5575
2
358.7 2-BOND WIRE SHORT FAILURES
125
5768
2
346.7 1-MECHANICAL DAMAGE, 1-GATE-OXIDE DEFECT
150
4643
3
646.1 1-INTERMITTENT BOND OPEN (HEEL OF WEDGE BOND),
1-GATE-OXIDE DEFECT,
1-MARG. HIGH RIN THRESHOLD (CAUSE UNKNOWN)
150
10,372
2
192.8 1-BOND WIRE OPEN WEDGE BONDS @ LEADFRAME,
1-HIGH IEE DUE TO GATE-OXIDE DEFECT
150
10,789
0
0.0
150
10,070
3
297.9 1-LOW R1IN RESISTANCE SCRATCH ON DIE,
1-HIGH IEE GATE-OXIDE DEFECT,
1-HIGH R2IN RESISTANCE ERR. FUSE BLOWN
150
10,929
3
274.5 1-HIGH R1IN RESISTANCE ERR. FUSE BLOWN,
1-T1OUT STUCK HIGH UNKNOWN DAMAGE IN FA,
1-R2IN INPUT THRESHOLD MARG. FAIL
135
15,727
2
127 2-UNKNOWN
135
6277
1
159 1-UNKNOWN
135
30,888
1
32 1-UNKNOWN
128,330
20
155.8
150
9443
4
423.6 1-AC FAILURE NO SCRATCH,
2-MARGINAL HIGH RESET THRESHOLD NO SCRATCH,
1-FUNCTIONAL FAILURE DUE TO DIE SCRATCH
150
4702
3
638.0 2-DIE SCRATCH ON SILICON SUBSTRATE,
1-DIE SCRATCH ON METAL LINES
150
9873
3
303.9 1-RESET THRESHOLD DUE TO DIE SCRATCH,
1-MARGINAL IBAT NO SCRATCH,
1-GATE-OXIDE RUPTURE POSSIBLY ESD DAMAGE
150
4295
0
0.0
28,313
10
353.2
135
2010
1
497 1-UNKNOWN
135
3191
0
0
135
5511
2
363 2-UNKNOWN
10,712
3
280
10 _____________________________________________________________________________________
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