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ADR441BRZ-REEL7 データシートの表示(PDF) - Analog Devices

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ADR441BRZ-REEL7 Ultralow Noise, LDO XFET Voltage References with Current Sink and Source ADI
Analog Devices ADI
ADR441BRZ-REEL7 Datasheet PDF : 20 Pages
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ADR440/ADR441/ADR443/ADR444/ADR445
ADR443 ELECTRICAL CHARACTERISTICS
VIN = 3.5 V to 18 V, TA = 25°C, CIN = COUT = 0.1 μF, unless otherwise noted.
Table 4.
Parameter
OUTPUT VOLTAGE
A Grade
B Grade
INITIAL ACCURACY
A Grade
B Grade
TEMPERATURE DRIFT
A Grade
B Grade
LINE REGULATION
LOAD REGULATION
QUIESCENT CURRENT
VOLTAGE NOISE
VOLTAGE NOISE DENSITY
TURN-ON SETTLING TIME
LONG-TERM STABILITY1
OUTPUT VOLTAGE HYSTERESIS
RIPPLE REJECTION RATIO
SHORT CIRCUIT TO GND
SUPPLY VOLTAGE OPERATING RANGE
SUPPLY VOLTAGE HEADROOM
Symbol
VO
Conditions
VOERR
TCVO
ΔVO/ΔVIN
ΔVO/ΔILOAD
ΔVO/ΔILOAD
IIN
eN p-p
eN
tR
VO
VO_HYS
RRR
ISC
VIN
VIN − VO
−40°C < TA < +125°C
−40°C < TA < +125°C
−40°C < TA < +125°C
ILOAD = 0 mA to 10 mA, VIN = 5 V,
−40°C < TA < +125°C
ILOAD = 0 mA to −5 mA, VIN = 5 V,
−40°C < TA < +125°C
No load, −40°C < TA < +125°C
0.1 Hz to 10 Hz
1 kHz
1000 hours
fIN = 10 kHz
Min
Typ Max
Unit
2.996 3.000 3.004 V
2.9988 3.000 3.0012 V
4
mV
0.13
%
1.2
mV
0.04
%
2
10
1
3
10
20
ppm/°C
ppm/°C
ppm/V
−50
+50
ppm/mA
−50
+50
ppm/mA
3
3.75
mA
1.4
μV p-p
57.6
nV/√Hz
10
μs
50
ppm
70
ppm
−75
dB
27
mA
3.5
18
V
500
mV
1 The long-term stability specification is noncumulative. The drift in the subsequent 1000-hour period is significantly lower than in the first 1000-hour period.
Rev. A | Page 5 of 20
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